UniMAP

Unimap is a Full Automatic Reflectivity mapping system

Specifications

Measure Time (Wafer / Cassette)

  • 31sec / 20.5min

Throughput (Monthly)

  • 52,000

Measure Time (Wafer / Cassette)

  • 150sec / 70.1min

Throughput (Monthly)

  • 15,400

Measure Time (Wafer / Cassette)

  • 76sec / 39.3min

Throughput (Monthly)

  • 27,400

Measure Time (Wafer / Cassette)

  • 270sec / 120.1min

Throughput (Monthly)

  • 8,990

Features

Features
Critical control of PSS process (Inner Wafer, Wafer/Wafer, Run/Run, Machine/Machine)
Real time monitoring optical power for Light source and Reflectivity of standard samples.
User Friendly Viewer / Wafer Carrier Viewer
Optional Bowing Mapping / Laser Marking
GEM/SECS Compatible

Benefits

Benefits
Wafer options for 2" to 6"
Wafer sorting function
Low maintenance, easy to use
Full automatic loading
2646 Lehigh Street
Whitehall, PA 18052, USA
(610) 443-2015
sales@sunboundtechnology.com